JEE: High Voltage, Low Risk

High Voltage, Low Risk

Auteur(s):	Ying Jiang (JEE), Ci Zhang (JEE),
Publié:	dSPACE Magazine 2/2020, Nov 2020

Modern electric drives combine high power with perfect control, down to the microsecond. In the development of today’s drives, manufacturers depend on efficient platforms that release these high powers while ensuring operational reliability. To achieve this, JEE uses hardware-in-the-loop (HIL) testing with powerful software modeling and SCALEXIO hardware from dSPACE.

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Anglais: High Voltage, Low Risk PDF, 970 KB
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Allemand: Hohe Spannung, niedriges Risiko PDF, 978 KB
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Chinois: 高电压，低风险 PDF, 1950 KB
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Japonais: High Voltage, Low Risk PDF, 1092 KB

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